Luminar 4020
In-Line Thin-Film AOTF-NIR Spectrometer
The Luminar 4020 is designed to measure multiple layers of thin films individually and eliminates the need to measure substrate thickness for accurate measurement of coating weight. Coating‑weight measurement and residual solvent levels are routinely performed with this high‑speed in‑line analyzer, which uses AOTF‑based NIR technology and can be mounted on a traveler to scan across the web or installed in a fixed position for continuous monitoring.
The 4020 integrated design is completely insensitive to ambient light, immune to vibration, dust, and dirt, which eases installation requirements in the production environment. Its optical design eliminates the interference fringes, enabling precise thin‑film measurements that were previously difficult or impossible with conventional in‑line spectrometers.
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Technical Specification
| Spectral Range Options | 600-1100 nm, 850-1700 nm, 900-1800 nm, 1100-2300 nm |
| Measurement Modes | Transmission |
| Spectral Resolution | 2-10 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Repeatability | ± 0.01 nm |
| Wavelength Increment | Software Selectable 1-10 nm |
| Ambient Light Rejection | > 106 |
| Non-Linearity | 0.1 % |
| Signal Digitalization | 16-bit A/D (1 part in 65,536) |
| Sampling Speed | 16,000 wavelength/sec |
| Sampling Area | Ø10 mm |
| Working Distance | 6 mm ± 0.5 mm (from reflecting surface to window flange) |
| Diagnostic | 10 Built-in monitoring sensors |
| Thickness Range | Typical 0-15 μm (standard); (above 15 μm it is possible to use models 4030 and 7030) |
| Permissible Sheet Flutter | ±5 mm and ±2 degrees |
| Power Requirements | 24 VDC, 80 Watts or 100-240 VAC, 50/60 Hz, 90 Watts |
| Cooling Options | Fan-cooled, Vortex-cooled |
| Communication | Wireless, OPC UA, Modbus (Serial or TCP), I/O with 4-20mA, TCP/IP Ethernet |
| Enclosure (W x H x D) | 275 mm x 372 mm x 157.50 mm |
Key Measurement Capabilities
The Luminar 4020 delivers high‑speed, non‑destructive NIR measurements that make it possible to monitor and control coating and film production in real time. Its fast AOTF‑based scanning measures key quality parameters directly on the moving web, giving manufacturers immediate feedback on process performance and supporting precise process control in web‑coating operations.
Key measurement focus areas include:
Coating Material — in‑line measurement of acrylic, epoxy, multi‑layer films, tapes, and other engineered coatings to ensure accurate coating weight and layer uniformity
Substrates — real‑time characterization of coatings applied to aluminum foil, metallized polymer films, polymer films, and other web substrates
Film & Coating Measurements — continuous, in‑line quantification of film thickness, coating weight on moving webs, and residual solvent levels to support process optimization