Luminar 4020 Thin-Film AOTF-NIR Spectrometer
In‑Line NIR Measurement of Thin Films and Coatings
The Luminar 4020 AOTF-NIR Thin-Film Spectrometer was designed to measure multiple layers of thin films individually and to eliminate the need to measure thickness of substrate for accurate coating weight. Coating weight of adhesive and residual solvent are routinely measured with this high-speed on-line analyzer, which can either be mounted on a traveler and scan across the web or measures statically.
The integrated Luminar 4020 is totally insensitive to ambient light, immune to vibration, dust, and dirt, which eases installation requirements in the production environment. An optical design eliminates the interference fringes making the measurement of thin films now possible using this on-line spectrometer.
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Technical Specification
| Spectral Range Options | 600-1100 nm, 850-1700 nm, 900-1800 nm, 1100-2300 nm |
| Measurement Modes | Transmission |
| Spectral Resolution | 2-10 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Repeatability | ± 0.01 nm |
| Wavelength Increment | Software Selectable 1-10 nm |
| Ambient Light Rejection | > 106 |
| Non-Linearity | 0.1 % |
| Signal Digitalization | 16-bit A/D (1 part in 65,536) |
| Sampling Speed | 16,000 wavelength/sec |
| Sampling Area | Ø10 mm |
| Working Distance | 6 mm ± 0.5 mm (from reflecting surface to window flange) |
| Diagnostic | 10 Built-in monitoring sensors |
| Thickness Range | Typical 0-15 μm (standard); (above 15 μm it is possible to use models 4030 and 7030) |
| Permissible Sheet Flutter | ±5 mm and ±2 degrees |
| Power Requirements | 24 VDC, 80 Watts or 100-240 VAC, 50/60 Hz, 90 Watts |
| Cooling Options | Fan-cooled, Vortex-cooled |
| Communication | Wireless, OPC UA, Modbus (Serial or TCP), I/O with 4-20mA, TCP/IP Ethernet |
| Enclosure (W x H x D) | 275 mm x 372 mm x 157.50 mm |
Key Measurement Capabilities
The Luminar 4020 delivers high‑speed, non‑destructive NIR measurements that enable real‑time monitoring and precise control of coating and film production.
Key measurement focus areas include:
Coating Material—Acrylic, Epoxy, Multi-layer Films and Tapes, etc.
Substrates—Aluminum Foil, Metallized Polymer Films, Polymer Films, etc.
On-line Measurement of Film Thickness, Coating on Film and Residual Solvents