Thin‑Film & Coating Measurement

Performing laboratory‑grade tasks on‑line with extreme accuracy, our high‑speed NIR Thin-Film spectrometer delivers precise, real‑time monitoring for thin films and coatings. Ideal for production lines, it measures single‑layer and multi‑layer coating thickness, analyze chemical composition, and track residual solvents and other critical parameters.


A Better Way to Ensure Thin‑Film & Coating Uniformity

On-Line Installation of Brimrose Luminar 4020  Thin-Film AOTF-NIR Spectrometer

On-Line Installation of Brimrose Luminar 4020
Thin-Film AOTF-NIR Spectrometer

The Luminar 4020 Thin‑Film spectrometer mounts on an automatic rail system to provide real‑time thin‑film and coating‑thickness measurements across the web. This setup delivers fast, repeatable data directly on the production line, optimizing process control to ensure uniformity in thin films and coatings.

On-Line Installation of Brimrose Luminar 4020
Thin-Film AOTF-NIR Spectrometer

Designed for tough industrial environments, the NIR spectrometer is unaffected by ambient light and resistant to vibration, dust, and dirt. Its advanced optical design ensures stable, cost‑effective operation while while minimizing waste and maintaining consistent coating quality.


Brimrose Luminar 4020 Thin-Film AOTF-NIR Spectrometer Mounted on an Automatic Rail

Brimrose Luminar 4020 Thin-Film AOTF-NIR Spectrometer Mounted on an Automatic Rail

Proven Benefits That Drive Performance

Implementing Brimrose AOTF‑NIR technology for thin‑film measurement and coating‑thickness analysis delivers clear, measurable benefits, including:

  • Non‑contact solid‑state NIR sensors with a compact, rugged design that deliver rapid full‑spectrum scanning for demanding industrial environments

  • Flexible measurement options, including traveler‑based web scanning or precise statistical spot measurements

  • Direct integration with plant PLC or DCS systems for instant or automated process adjustments

  • Significant reductions in laboratory testing and analysis, saving time and operational costs for manufacturers worldwide

Proven Benefits That Drive Performance

Implementing Brimrose AOTF‑NIR technology for thin‑film measurement and coating‑thickness analysis delivers clear, measurable benefits, including:

  • Non‑contact solid‑state NIR sensors with a compact, rugged design that deliver rapid full‑spectrum scanning for demanding industrial environments

  • Flexible measurement options, including traveler‑based web scanning or precise statistical spot measurements

  • Direct integration with plant PLC or DCS systems for instant or automated process adjustments

  • Significant reductions in laboratory testing and analysis, saving time and operational costs for manufacturers worldwide

Brimrose Luminar 4020 Thin-Film AOTF-NIR Spectrometer Mounted on an Automatic Rail


Solution Note & NIR Application Reports

We provide a featured Solution Note and a selection of NIR application reports that demonstrate how our NIR spectrometers deliver precise, reliable measurement performance for thin‑film and coating‑thickness uniformity. If you would like access to any of these reports or additional application data, please contact us to request a copy.

  • View Solution Note

  • Direct Thin‑Film Thickness Measurement

  • Measurement of Urethane Coating Thickness on Polyethylene Terephthalate Film

  • Measuring Ethylene‑Vinyl Chloride (EVOH) Thickness on a Polymer Sheet

  • Rapid Non‑Contact Determination of Coating Thickness on Different Types of Paper

  • Measuring Coating Thickness on a Composite Tape

  • Measuring Dry Coating Thickness on Painted Aluminum

  • Determination of Percent Solids and Drying in Lost Foam Coatings


Model Options

Find the Right NIR Solution for Your Application

Tell us about your thin‑film and coating measurement needs, and our experts will help you identify the optimal NIR solution or spectrometer configuration for your process.

Talk to an Expert