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VMS 2000/3000 Laser Vibrometers
The VMS 2000/3000 laser vibrometers are based on Photo-EMF technology that allows the characterization and monitoring of vibration without the need of target surface treatment or surface preparation. The instantaneous velocity and displacement of a vibrating structure are determined from the Doppler frequency shift measurement of back-scattered light without involving the use of conventional optical interferometers.
The high measurement sensitivity of the VMS 2000/3000, coupled with the high degree of spatial adaptability of photo-EMF sensors, enables these laser vibrometers to be employed in a wide range of industrial applications, including aerospace, automotive and process control industries that might involove significant background noise and vibrations.

The VMS 2000/3000 allows for non-contact vibration or motion measurements that are precise, simple, flexible and more cost effective and rewarding than ever before.

Go to laser vibrometer application page to see an application abstract - Laser Vibrometer Using Photo-EMF Sensors and more information about other laser vibrometers applications. For requesting laser vibrometers price quote, please fill in the price quote request form.
Applications and Features
Applications of Process Photo EMF Laser Vibrometer:
  • Photo-EMF RF Signal Correlator/Processor
  • Photorefractive RF Signal Correlator
  • RF Terrain Mapping and Target Profiling
  • RF Radar Spectral Analysis
  • Laser Mine Detection (Army)
  • Aircraft/Rotorcraft Vibration
  • Noise Determination and Elimination
  • Lamination Integrity of Composites
  • 60 Picometer (10 -12) Displacement - World Record achieved at Brimrose
Features of Laser Vivrometers:
  • Non-Contact
  • NOT Sensitive to Speckle Patterns
  • No Need for "Fringe Counting"
  • Real Time Monitoring
  • High Sensitivity Measurements
  • Up to 200 kHz Bandwidth
  • Wireless or Internet Communication Available
  • Integrated Laser Pointers for Visual Target Positioning
  • Scanning Distance 1m (up to 4m available upon request)
  • Single Point Measurements (Differential, 3D/Multi-Axis, Angular and in plane measurements are available upon request)